Simulasi Model Biosensor Nanobeam pada Sistem Nanoelektromekanik untuk Deteksi Penyakit

Abstract

Model biosensor nanobeam clamped-clamped pada sistem nanoelektromekanik digunakan untuk merepresentasikan respons biosensor dalam mendeteksi analit melalui perubahan defleksi nanobeam. Model matematis berupa persamaan gerak nonlinier hasil reduksi Galerkin diselesaikan menggunakan Elzaki Variational Iteration Method (EVIM) dan dibandingkan dengan metode numerik Runge-Kutta orde empat (RK4). Hasil simulasi menunjukkan bahwa variasi nonlinearitas geometri, gaya aksial, dan gaya van der Waals menghasilkan perubahan respons dinamis nanobeam. Nonlinearitas geometri dan gaya aksial memengaruhi karakteristik osilasi yang berkaitan dengan sensitivitas biosensor, sedangkan gaya van der Waals meningkatkan defleksi nanobeam akibat interaksi pada skala nano. Perubahan respons tersebut menunjukkan bahwa defleksi nanobeam dapat digunakan sebagai indikator keberadaan analit dalam proses deteksi. Solusi EVIM menunjukkan kesesuaian yang baik dengan RK4 pada variasi amplitudo awal, nonlinearitas geometri, dan gaya aksial. Namun, pada variasi gaya van der Waals, EVIM belum mampu merepresentasikan respons sistem secara penuh pada rentang parameter yang digunakan.

A clamped-clamped nanobeam biosensor model in a nanoelectromechanical system is used to represent the biosensor response for analyte detection through changes in nanobeam deflection. The mathematical model, consisting of nonlinear equations of motion derived from the Galerkin reduction was solved using the Elzaki Variational Iteration Method (EVIM) and validated against the fourth-order Runge-Kutta (RK4) numerical method. Simulation results show that variations in geometric nonlinearity, axial force, and van der Waals force alter the dynamic response of the nanobeam. Geometric nonlinearity and axial force affect the oscillatory behavior associated with biosensor sensitivity, whereas van der Waals force increases the nanobeam deflection due to nanoscale interactions. These response variations indicate that nanobeam deflection can serve as an indicator of analyte presence during the detection process. The EVIM solution shows good agreement with RK4 for variations in initial amplitude, geometric nonlinearity, and axial force. However, under variations in van der Waals force, EVIM is not able to fully capture the system response within the parameter range considered.