Kuantifikasi Fase Mineral Pembawa Tembaga dalam Konsentrat Tembaga Antar-Blok Penambangan dengan Metode Rietveld

Abstract

Evaluasi kualitas konsentrat tembaga berbasis kadar Cu total belum menunjukkan fase mineral pembawa Cu. Penelitian ini bertujuan menentukan fase mineral pembawa Cu dan kadar Cu kristalin menggunakan Rietveld refinement berbasis X-ray Diffraction (XRD), serta mengevaluasi kesesuaiannya dengan kadar Cu total hasil Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES). Sampel dari lima lokasi dikeringkan, diseragamkan hingga 45 µm, dianalisis menggunakan XRD, dan dikuantifikasi melalui Rietveld refinement. Hasil menunjukkan konsentrat tembaga didominasi kalkopirit sebesar 73,22-77,54 wt% dan pirit sebesar 22,46-26,78 wt%. Variasi lokasi ditunjukkan oleh lokasi B dengan kalkopirit dan Cu kristalin tertinggi, sedangkan lokasi C terendah. Kadar Cu kristalin berada pada rentang 25,35-26,85 wt%. Analisis statistik menunjukkan hubungan sangat kuat dan tidak terdapat perbedaan signifikan antara XRD-Rietveld dan ICP-OES. XRD-Rietveld berpotensi menjadi pendekatan komplementer dalam evaluasi kualitas konsentrat tembaga berbasis fase mineral pembawa Cu.

Evaluating copper concentrate quality based solely on total Cu content does not reveal the mineral phases carrying the Cu. This study aims to determine the Cubearing mineral phases and crystalline Cu content using Rietveld refinement based on X-ray Diffraction (XRD), as well as to evaluate its consistency with the total Cu content obtained from Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES). Samples from five locations were dried, homogenized to 45 µm, analyzed using XRD, and quantified via Rietveld refinement. The results show that the copper concentrate is dominated by chalcopyrite at 73.22-77.54 wt% and pyrite at 22.46-26.78 wt%. Locational variation was demonstrated by Location B, which exhibited the highest chalcopyrite and crystalline Cu content, while Location C was the lowest. The crystalline Cu content ranged from 25.35 to 26.85 wt%. Statistical analysis indicated a very strong correlation and no significant difference between the XRD-Rietveld and ICP-OES methods. XRD-Rietveld has the potential to serve as a complementary approach in evaluating copper concentrate quality based on its Cu-bearing mineral phases.