Please use this identifier to cite or link to this item: http://repository.ipb.ac.id/handle/123456789/157425
Title: Identifikasi Faktor Penyebab Reject Kulit Wafer Flat Pada Proses Baking di PT XYZ
Other Titles: Identification of Causal Factors of Flat Wafer Sheet Rejects in the Baking Process at PT XYZ
Authors: Hastati, Dwi Yuni
Masyhuri, Putri Ananda Riza
Issue Date: 2024
Publisher: IPB University
Abstract: Kualitas wafer flat sangat penting untuk efisiensi produksi dan kualitas produk akhir. Namun, masalah reject kulit wafer flat sering menjadi hambatan dalam mencapai target produksi. Tujuan dari penelitian ini adalah untuk melakukan identifikasi dan menganalisis faktor – faktor yang menyebabkan reject selama periode waktu tertentu dengan menggunakan metode seven toolsseperti checksheet, diagram pareto, bagan kendali p, diagram Ishikawa. Kemudian kemungkinan penyebab dievaluasi untuk menentukan langkah – langkah perbaikan yang efektif guna mengurangi jumlah reject dan meningkatkan kualitas kulit wafer flat. Terdapat 3 jenis ketidaksesuaian yang ditemukan yaitu simping patah, simping double, dan simping grepes. Analisis pareto menunjukkan bahwa simping patah merupakan permasalahan yang paling dominan dan menyumbang 86% dari total reject. Setelah dilakukan implementasi tindakan pengendalian ditemukan jumlah reject simping patah 77% dari total reject. Sehingga terjadi penurunan jumlah reject sebanyak 9%. Perusahaan harus mengimplementasikan rancangan perbaikan secara kontinu untuk menghasilkan profitabilitas perusahaan yang diinginkan.
The quality of wafer flats is critical to production efficiency and final product quality. However, the problem of flat wafer sheet rejects is often an obstacle in achieving production targets. The purpose of this study is to identify and analyze the factors that cause rejects over a period of time using seven tools such as checksheet, pareto diagram, p-control chart, Ishikawa diagram. Then the possible causes are evaluated to determine effective corrective measures to reduce the number of rejects and improve the quality of flat wafer sheet. There are 3 types of non-conformities found, namely broken wafer sheet, double wafer sheet, and grepes wafer sheet. Based on Pareto analysis, broken wafer sheet is the most dominant problem and accounts for 86% of the total rejects. After the implementation of control measures, it was found that the number of rejects of broken wafer sheet was 77% of the total rejects. So that there is a decrease in the number of rejects by 9%. The company must implement the improvement plan continuously to produce the desired company profitability.
URI: http://repository.ipb.ac.id/handle/123456789/157425
Appears in Collections:UT - Supervisor of Food Quality Assurance

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