Please use this identifier to cite or link to this item: http://repository.ipb.ac.id/handle/123456789/154767
Title: Pengendalian Mutu Kadar Air Produk Wafer Flat di PT XYZ
Other Titles: Quality Control of Moisture Content of Flat Wafer Products at PT XYZ
Authors: Anggarkasih, Made Gayatri
Ramadhani , Ade Novitrah
Issue Date: 2024
Publisher: IPB University
Abstract: Dalam menciptakan wafer yang bermutu perlu dilakukan tindakan pengendalian terhadap nilai kadar air. Kadar air merupakan indikator penting dalam menentukan umur simpan dan tekstur wafer yang akan dihasilkan. Tujuan penelitian ini yaitu untuk menganalisis dan mengevaluasi keterkendalian kadar air kulit wafer dan produk akhir wafer flat. Metode penelitian menggunakan analisis bagan kendali X-Bar dan R-Bar. Kadar air kulit wafer terkendali berdasarkan grafik X-Bar dan tidak terkendali berdasarkan grafik R-Bar, sedangkan kadar air produk akhir wafer flat yang dihasilkan PT XYZ tidak terkendali secara statistik. Analisis penyebab tidak terkendalinya nilai kadar air dilakukan dengan menggunakan diagram sebab akibat. Faktor-faktor yang mempengaruhi nilai kadar air yaitu faktor manusia, mesin, lingkungan, metode dan bahan. Tindakan pengendalian yang dapat dilakukan oleh perusahaan adalah menetapkan SOP pengambilan sampel pengujian kadar air, setting suhu oven, setting kecepatan baking plate, mencegah terjadinya downtime mesin oven dan mesin packing serta menetapkan maintenance mesin secara teratur.
In creating quality wafers, it is necessary to take control measures on the moisture content value. Moisture content is an important indicator in determining the shelf life and texture of the wafer to be produced. The purpose of this study is to analyze and evaluate the controllability of the moisture content of wafer shells and wafer flat final products. The research method uses X-Bar and R-Bar control chart analysis. The moisture content of the wafer shell is controlled based on the XBar graph and uncontrolled based on the R-Bar graph whereas, the moisture content of the final product of the flat wafer produced by PT XYZ is not statistically controlled. The analysis of the causes of uncontrollable water content values was carried out using a cause-and-effect diagram. Factors that affect the value of moisture content are human, mechanical, environmental, method and material factors. Control actions that can be taken by the company are to establish SOPs for sampling moisture content testing, setting oven temperatures, setting baking plate speeds, preventing downtime of oven machines and packing machines, and establishing regular machine maintenance.
URI: http://repository.ipb.ac.id/handle/123456789/154767
Appears in Collections:UT - Supervisor of Food Quality Assurance

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