Please use this identifier to cite or link to this item: http://repository.ipb.ac.id/handle/123456789/132565
Title: Pengaruh Variasi Suhu Pre-Treatment Metode Leaching dalam Ekstraksi Silika TKKS sebagai Material Semikonduktor
Other Titles: Effect of Temperature Variation in Pre-Treatment Leaching Method on Silica Extraction from OPEFB as Semiconductor Material
Authors: Nikmatin, Siti
Syafutra, Heriyanto
Yuliardi, Annisa
Issue Date: 27-Nov-2023
Publisher: IPB University
Abstract: Perkebunan kelapa sawit di Indonesia menghasilkan limbah tandan kosong kelapa sawit (TKKS) yang mengandung komposisi kimia silika yang dapat diekstraksi dan dimanfaatkan sebagai bahan baku material semikonduktor silikon. Dalam penelitian ini, Bagian stalk dan spikelet dipanaskan dengan variasi suhu 500 ˚C, 700 ˚C, dan 900 ˚C sampai menjadi abu lalu diekstraksi menggunakan metode leaching menggunakan asam sitrat 2%. Karakterisasi yang dilakukan berupa penghitungan kadar susut massa, pengujian sifat kelistrikan menggunakan LCRmeter, dan pengujian komposisi unsur kimia menggunakan EDX. Hasil penelitian menunjukkan suhu pemanasan yang tinggi dapat meningkatkan kadar impuritas yang terbuang setelah pencucian asam. Konduktivitas dan resistivitas dari pengujian LCRmeter menunjukkan sampel akhir setelah perlakuan leaching memiliki sifat kelistrikan dalam rentang semikonduktor. Pengujian EDX menunjukkan adanya unsur karbon, oksigen, silikon, dan alumunium menunjukkan impuritas belum terbuang secara sempurna pada proses ekstraksi.
Palm oil plantations in Indonesia produce oil palm biomass waste oil palm empty fruit bunch (OPEFB) containing silica in its chemical composition. Silica from OPEFB can be extracted and utilized as a raw material for silicon semiconductor. In this study, the stalk and spikelet parts of OPEFB were prepared by heating at varying temperatures of 500 °C, 700 °C, and 900 °C forming ash then OPEFB ash was extracted using a leaching method with 2% citric acid. Characterization involved calculating mass loss rate, testing electrical properties using an LCRmeter, and analyzing the chemical composition using EDX. The results showed that higher heating temperatures can increase the impurity that removed after leaching. Conductivity and resistivity tests using the LCRmeter indicated that the final samples after leaching treatment exhibited semiconductor like electrical properties. The EDX analysis revealed the presence of carbon, oxygen, silicon, and aluminum indicates that impurities were not completely removed during the extraction process.
URI: http://repository.ipb.ac.id/handle/123456789/132565
Appears in Collections:UT - Physics

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