Please use this identifier to cite or link to this item: http://repository.ipb.ac.id/handle/123456789/117107
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dc.contributor.advisorIrmansyah-
dc.contributor.advisorIrzaman-
dc.contributor.authorPrastya, Fajar-
dc.date.accessioned2023-04-12T23:54:44Z-
dc.date.available2023-04-12T23:54:44Z-
dc.date.issued2023-
dc.identifier.urihttp://repository.ipb.ac.id/handle/123456789/117107-
dc.description.abstractBarium Stronsium Titanat (BST) sangat menarik perhatian peniliti karena memiliki permitivitas dielektrik yang tinggi serta aktifitas feroelektrik. Oleh karena itu dalam penilitian ini telah dilakukan analisis menggunakan metode rietveld dengan basis data XRD barium stronsium titanat yang didadah klorofil dan niobium menggunakan perangkat lunak Mineral Analysis Using Diffraction (MAUD). Hasil menunjukkan parameter kisi rata-rata adalah a=b=c= 3.959 Å, α=β =γ= 90 dan struktur kristal berbentuk kubik, grup ruang (space group) : Pm- 3m. Analisis menggunakan metode rietveld menghasilkan masing-masing nilai Rexp pada lima sampel : 36.11 % (0% control), 62.94% (5% klorofil), 46.57% (5% niobium), 8.49% (10% klorofil), 20.99% (10% niobium)id
dc.description.abstractBarium Strontium Titanate (BST) is of great interest to researchers because it has a high dielectric permittivity and ferroelectric activity. Therefore, in this research an analysis was carried out using the Rietveld method with an XRD database of barium strontium titanate containing chlorophyll and niobium using Mineral Analysis Using Diffraction (MAUD) software. The results show that the average lattice parameters are a=b=c= 3.959 Å, α=β =γ= 90 and the crystal structure is cubic in shape, space group : Pm-3m. Analysis using the Rietveld method yielded Rexp values for each of the five samples: 36.11% (0% control), 62.94% (5% chlorophyll), 46.57% (5% niobium), 8.49% (10% chlorophyll), 20.99% (10% niobium)id
dc.language.isoidid
dc.publisherIPB Universityid
dc.titleAnalisis Rietveld pada Lapisan Tipis Ba0.5Sr0.5TiO3 didadah Niobium dan Klorofil dengan Perangkat Lunak Mineral Analysis Using Diffraction (MAUD) Berbasis Data Spektral XRDid
dc.typeUndergraduate Thesisid
dc.subject.keywordBSTid
dc.subject.keywordMAUDid
dc.subject.keywordRexpid
dc.subject.keywordRietveldid
dc.subject.keywordXRDid
Appears in Collections:UT - Physics

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