View Item 
      •   IPB Repository
      • Dissertations and Theses
      • Undergraduate Theses
      • UT - Vocational School
      • UT - Supervisor of Food Quality Assurance
      • View Item
      •   IPB Repository
      • Dissertations and Theses
      • Undergraduate Theses
      • UT - Vocational School
      • UT - Supervisor of Food Quality Assurance
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.

      Pengendalian Mutu Kadar Air Produk Wafer Flat di PT XYZ

      No Thumbnail [100%x80]
      View/Open
      Cover (1.289Mb)
      Fulltext (4.316Mb)
      Lampiran (1.667Mb)
      Date
      2024
      Author
      Ramadhani , Ade Novitrah
      Anggarkasih, Made Gayatri
      Metadata
      Show full item record
      Abstract
      Dalam menciptakan wafer yang bermutu perlu dilakukan tindakan pengendalian terhadap nilai kadar air. Kadar air merupakan indikator penting dalam menentukan umur simpan dan tekstur wafer yang akan dihasilkan. Tujuan penelitian ini yaitu untuk menganalisis dan mengevaluasi keterkendalian kadar air kulit wafer dan produk akhir wafer flat. Metode penelitian menggunakan analisis bagan kendali X-Bar dan R-Bar. Kadar air kulit wafer terkendali berdasarkan grafik X-Bar dan tidak terkendali berdasarkan grafik R-Bar, sedangkan kadar air produk akhir wafer flat yang dihasilkan PT XYZ tidak terkendali secara statistik. Analisis penyebab tidak terkendalinya nilai kadar air dilakukan dengan menggunakan diagram sebab akibat. Faktor-faktor yang mempengaruhi nilai kadar air yaitu faktor manusia, mesin, lingkungan, metode dan bahan. Tindakan pengendalian yang dapat dilakukan oleh perusahaan adalah menetapkan SOP pengambilan sampel pengujian kadar air, setting suhu oven, setting kecepatan baking plate, mencegah terjadinya downtime mesin oven dan mesin packing serta menetapkan maintenance mesin secara teratur.
       
      In creating quality wafers, it is necessary to take control measures on the moisture content value. Moisture content is an important indicator in determining the shelf life and texture of the wafer to be produced. The purpose of this study is to analyze and evaluate the controllability of the moisture content of wafer shells and wafer flat final products. The research method uses X-Bar and R-Bar control chart analysis. The moisture content of the wafer shell is controlled based on the XBar graph and uncontrolled based on the R-Bar graph whereas, the moisture content of the final product of the flat wafer produced by PT XYZ is not statistically controlled. The analysis of the causes of uncontrollable water content values was carried out using a cause-and-effect diagram. Factors that affect the value of moisture content are human, mechanical, environmental, method and material factors. Control actions that can be taken by the company are to establish SOPs for sampling moisture content testing, setting oven temperatures, setting baking plate speeds, preventing downtime of oven machines and packing machines, and establishing regular machine maintenance.
       
      URI
      http://repository.ipb.ac.id/handle/123456789/154767
      Collections
      • UT - Supervisor of Food Quality Assurance [110]

      Copyright © 2020 Library of IPB University
      All rights reserved
      Contact Us | Send Feedback
      Indonesia DSpace Group 
      IPB University Scientific Repository
      UIN Syarif Hidayatullah Institutional Repository
      Universitas Jember Digital Repository
        

       

      Browse

      All of IPB RepositoryCollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

      My Account

      Login

      Application

      google store

      Copyright © 2020 Library of IPB University
      All rights reserved
      Contact Us | Send Feedback
      Indonesia DSpace Group 
      IPB University Scientific Repository
      UIN Syarif Hidayatullah Institutional Repository
      Universitas Jember Digital Repository
        

       

      NoThumbnail